Test Date: 2015-06-05 18:06
Chip 12
X-ray Calibration - Target Zn Method Spectrum Chip C12
Center |
Center of Peak |
49.01 ± 0.07 |
Vcal |
TargetEnergy |
Energy of target Zn |
8638.91 |
eV |
TargetNElectrons |
Energy of target Zn |
2399.7 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
53.78 |
|
Rate |
Rate |
289.30 |
kHz/cm² |
X-ray Calibration - Target Mo Method Spectrum Chip C12
Center |
Center of Peak |
97.97 ± 0.06 |
Vcal |
TargetEnergy |
Energy of target Mo |
17479.37 |
eV |
TargetNElectrons |
Energy of target Mo |
4855.38 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
39.28 |
|
Rate |
Rate |
454.40 |
kHz/cm² |
X-ray Calibration - Target Ag Method Spectrum Chip C12
Center |
Center of Peak |
124.21 ± 0.08 |
Vcal |
TargetEnergy |
Energy of target Ag |
22162.92 |
eV |
TargetNElectrons |
Energy of target Ag |
6156.37 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
18.08 |
|
Rate |
Rate |
241.50 |
kHz/cm² |
X-ray Calibration - Target Sn Method Spectrum Chip C12
Center |
Center of Peak |
141.06 ± 0.11 |
Vcal |
TargetEnergy |
Energy of target Sn |
25271.36 |
eV |
TargetNElectrons |
Energy of target Sn |
7019.82 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
12.43 |
|
Rate |
Rate |
152.10 |
kHz/cm² |
X-ray Calibration - Vcal Calibration Method Spectrum Chip C12
Slope |
Slope |
50.08 ± 0.058 |
nElectrons/VCal |
Offset |
Offset |
-54.136 ± 5.812 |
nElectrons |
X-ray Hit Map - Target Zn Method Spectrum Chip C12
Rate |
Rate |
289.30 |
kHz/cm² |
NTrigs |
N Trig |
5913115 |
Trigger |
NHits |
N Hits |
26690 |
Hits |
X-ray Hit Map - Target Mo Method Spectrum Chip C12
Rate |
Rate |
454.40 |
kHz/cm² |
NTrigs |
N Trig |
5913243 |
Trigger |
NHits |
N Hits |
41913 |
Hits |
X-ray Hit Map - Target Ag Method Spectrum Chip C12
Rate |
Rate |
241.50 |
kHz/cm² |
NTrigs |
N Trig |
5913128 |
Trigger |
NHits |
N Hits |
22279 |
Hits |
X-ray Hit Map - Target Sn Method Spectrum Chip C12
Rate |
Rate |
152.10 |
kHz/cm² |
NTrigs |
N Trig |
5912980 |
Trigger |
NHits |
N Hits |
14027 |
Hits |