Test Date: 2015-06-02 16:06
M0209 ModuleFulltest_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module M0209
Grade Grade A
PixelDefects Pixel Defects - A/B/C 67 - 0/0/0
DeadPixels Dead Pixels 17
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 15
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 15
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-06-02
TestTime Test Time 16:06
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 167.26 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 68.31 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1212.16 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 1.03
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:15:24
MinCurrent min. Current 0.465 A
MaxCurrent max. Current 0.47 A
Digital Current
Plot
Duration Duration 1:15:24
MinCurrent min. Current 0.387 A
MaxCurrent max. Current 0.391 A
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 3 0 0 2 1 0 0 0 0 0 0
Chip 1 2 2 0 0 0 0 0 4 0 0 0
Chip 2 4 4 0 0 0 0 0 0 0 0 0
Chip 3 8 0 0 0 8 0 0 0 0 0 0
Chip 4 8 3 0 0 5 0 0 2 0 0 0
Chip 5 1 1 0 0 0 0 0 0 0 0 0
Chip 6 8 0 0 0 8 0 0 1 0 0 0
Chip 7 1 0 0 0 1 0 0 0 0 0 0
Chip 8 2 0 0 0 2 0 0 0 0 0 0
Chip 9 7 0 0 0 7 0 0 0 0 0 0
Chip 10 5 0 0 0 5 0 0 1 0 0 0
Chip 11 4 0 0 0 4 0 0 1 0 0 0
Chip 12 2 0 0 0 2 0 0 0 0 0 0
Chip 13 2 0 0 0 2 0 0 1 0 0 0
Chip 14 3 3 0 0 0 0 0 5 0 0 0
Chip 15 7 4 0 0 3 0 0 0 0 0 0
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