Test Date: 2015-06-02 16:06
M0207 ModuleFulltest_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module M0207
Grade Grade C
PixelDefects Pixel Defects - A/B/C 4229 - 0/0/0
DeadPixels Dead Pixels 4166
AddressProblems Address Problems 1
ThresholdDefects Threshold Defects 4171
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 6
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 4171
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-06-02
TestTime Test Time 16:06
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 155.20 e
NoiseROCs Noise grades 15/0/1
VcalThrWidth Vcal Thr. Width 63.31 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.00 %
RelGainWidthROCs Rel. Gain W. grades 0/0/16
PedestalSpread Pedestal Spread 0.00 e
PedestalSpreadROCs Ped. Spread grades 13/0/3
Parameter1 Parameter1 0.91
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:13:36
MinCurrent min. Current 0.505 A
MaxCurrent max. Current 0.51 A
Digital Current
Plot
Duration Duration 1:13:36
MinCurrent min. Current 0.396 A
MaxCurrent max. Current 0.4 A
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 4 0 0 0 4 0 0 0 0 0 0
Chip 1 15 0 0 2 13 0 0 1 0 0 0
Chip 2 9 0 0 1 8 0 0 0 0 0 0
Chip 3 3 0 0 0 3 0 0 0 0 0 0
Chip 4 5 0 0 1 4 0 0 0 0 0 0
Chip 5 0 0 0 0 0 0 0 0 0 0 0
Chip 6 7 1 0 0 6 0 0 0 0 0 0
Chip 7 2 2 0 0 0 0 0 2 0 0 0
Chip 8 5 0 0 0 5 0 0 0 0 0 0
Chip 9 6 1 0 0 5 0 0 1 0 0 0
Chip 10 0 0 0 0 0 0 0 0 0 0 0
Chip 11 5 1 0 0 4 0 0 0 0 0 0
Chip 12 2 0 0 0 2 0 0 2 0 0 0
Chip 13 3 1 0 1 0 1 0 3 0 0 0
Chip 14 4160 4160 0 0 0 0 0 4160 0 0 0
Chip 15 3 0 0 1 2 0 0 2 0 0 0
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