Test Date: 2015-06-02 16:06
M0206 ModuleFulltest_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module M0206
Grade Grade A
PixelDefects Pixel Defects - A/B/C 105 - 0/0/0
DeadPixels Dead Pixels 4
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 7
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 23
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 7
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-06-02
TestTime Test Time 16:06
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 158.35 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 65.38 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1210.47 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 1.01
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:02:05
MinCurrent min. Current 0.463 A
MaxCurrent max. Current 0.468 A
Digital Current
Plot
Duration Duration 1:02:05
MinCurrent min. Current 0.38 A
MaxCurrent max. Current 0.384 A
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 19 0 0 17 2 0 0 0 0 0 0
Chip 1 13 0 0 0 13 0 0 1 0 0 0
Chip 2 8 1 0 0 7 0 0 0 0 0 0
Chip 3 1 0 0 0 1 0 0 0 0 0 0
Chip 4 1 0 0 0 1 0 0 1 0 0 0
Chip 5 2 1 0 1 0 0 0 1 0 0 0
Chip 6 1 1 0 0 0 0 0 2 0 0 0
Chip 7 15 0 0 3 12 0 0 0 0 0 0
Chip 8 9 0 0 0 9 0 0 0 0 0 0
Chip 9 4 0 0 0 4 0 0 0 0 0 0
Chip 10 16 1 0 1 14 0 0 0 0 0 0
Chip 11 1 0 0 1 0 0 0 0 0 0 0
Chip 12 2 0 0 0 2 0 0 0 0 0 0
Chip 13 7 0 0 0 7 0 0 1 0 0 0
Chip 14 0 0 0 0 0 0 0 1 0 0 0
Chip 15 6 0 0 0 6 0 0 0 0 0 0
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