Test Date: 2015-03-26 13:03
D4009 ModuleFulltest_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module D4009
Grade Grade A
PixelDefects Pixel Defects - A/B/C 41 - 0/0/0
DeadPixels Dead Pixels 7
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 14
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 10
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 14
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-03-26
TestTime Test Time 13:03
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 150.90 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 74.25 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1277.53 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.97
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:07:25
MinCurrent min. Current 0.43 A
MaxCurrent max. Current 0.439 A
Digital Current
Plot
Duration Duration 1:07:25
MinCurrent min. Current 0.381 A
MaxCurrent max. Current 0.383 A
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 4 0 0 0 4 0 0 5 0 0 0
Chip 1 1 0 0 0 1 0 0 0 0 0 0
Chip 2 1 0 0 1 0 0 0 0 0 0 0
Chip 3 0 0 0 0 0 0 0 0 0 0 0
Chip 4 0 0 0 0 0 0 0 0 0 0 0
Chip 5 3 0 0 0 3 0 0 0 0 0 0
Chip 6 1 0 0 1 0 0 0 0 0 0 0
Chip 7 1 0 0 0 1 0 0 0 0 0 0
Chip 8 7 6 0 0 1 0 0 6 0 0 0
Chip 9 9 0 0 0 9 0 0 0 0 0 0
Chip 10 2 1 0 0 1 0 0 3 0 0 0
Chip 11 0 0 0 0 0 0 0 0 0 0 0
Chip 12 1 0 0 0 1 0 0 0 0 0 0
Chip 13 1 0 0 0 1 0 0 0 0 0 0
Chip 14 2 0 0 0 2 0 0 0 0 0 0
Chip 15 8 0 0 8 0 0 0 0 0 0 0
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