Test Date: 2015-10-30 10:46
Analysis date: 2015-11-23 15:56
M3518 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M3518
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 304 - 13/3/0
DeadPixels Dead Pixels 281
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 17
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 6
PHGainDefects PH Gain Defects 121
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center Perugia
TestDate Test Date 2015-10-30
TestTime Test Time 10:46
TestDuration Test Duration 1:35:29
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar prod-11
ModuleIa Module Ia 386.7 mA
Summary 3
Noise Noise 137.07 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 48.09 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1154.53 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.72
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:35:29
MinCurrent min. Current 0.359 A
MaxCurrent max. Current 0.523 A
Analog Current
Duration Duration 1:35:29
MinCurrent min. Current 0.07 A
MaxCurrent max. Current 0.391 A
ModuleIa Module Ia 386.7 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.07 °C
Duration Duration of test 1:37:04
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
1
0
1
0
0
0
0
0
0
0
116.95
1749
46
0.026
1266
Chip 1
B
89
84
0
0
2
0
0
5
24
0
0
146.64
1748
57
0.040
1189
Chip 2
B
51
50
0
0
1
0
0
0
15
0
0
137.74
1748
46
0.031
1162
Chip 3
A
3
3
0
0
0
0
0
0
2
0
0
133.78
1748
45
0.038
1294
Chip 4
A
1
1
0
0
0
0
0
0
0
0
0
131.00
1751
44
0.040
943
Chip 5
A
9
9
0
0
0
0
0
0
8
0
0
143.16
1746
48
0.025
1416
Chip 6
A
39
39
0
0
0
0
0
0
16
0
0
139.78
1752
48
0.034
1388
Chip 7
A
7
3
0
0
0
0
0
4
1
0
0
151.79
1749
52
0.029
1150
Chip 8
A
11
6
0
0
2
0
0
2
7
0
0
147.46
1750
48
0.027
1022
Chip 9
B
44
44
0
0
0
0
0
0
21
0
0
128.79
1752
44
0.034
1014
Chip 10
A
26
23
0
0
0
0
0
3
9
0
0
149.24
1753
52
0.034
1148
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
135.73
1749
48
0.030
965
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
112.04
1749
44
0.028
1144
Chip 13
A
16
14
0
0
1
0
0
2
13
0
0
129.77
1751
46
0.026
1099
Chip 14
A
5
4
0
0
0
0
0
0
5
0
0
132.08
1750
46
0.030
1146
Chip 15
A
1
0
0
0
0
0
0
1
0
0
0
157.11
1752
52
0.035
1128
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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