Test Date: 2015-09-24 18:23
Analysis date: 2015-11-23 15:47
M3508 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3508
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 45 - 16/0/0
DeadPixels Dead Pixels 40
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 0
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 31
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 1
Summary 2
TestCenter Test Center Perugia
TestDate Test Date 2015-09-24
TestTime Test Time 18:23
TestDuration Test Duration 1:41:37
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-10+28 gfc1aea5
ModuleIa Module Ia 381 mA
Summary 3
Noise Noise 150.15 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 50.00 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1239.50 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.78
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.43 μA
CurrentVariation I(150 V) / I(100 V) 1.14
IVCurve
CurrentAtVoltage150V I(150 V) 0.43 μA
Variation I(150 V) / I(100 V) 1.14
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:41:37
MinCurrent min. Current 0.358 A
MaxCurrent max. Current 0.473 A
Analog Current
Duration Duration 1:41:37
MinCurrent min. Current 0.064 A
MaxCurrent max. Current 0.384 A
ModuleIa Module Ia 381 mA
Temperature
Temperature Temp. while test 16.99 +/- 0.17 °C
Duration Duration of test 1:44:17
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
154.71
1750
52
0.027
1274
Chip 1
A
20
18
0
0
0
0
0
1
12
0
1
147.70
1752
50
0.035
1522
Chip 2
A
2
2
0
0
0
0
0
0
2
0
0
154.64
1748
53
0.028
1192
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
150.06
1748
48
0.031
1338
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
141.67
1752
46
0.032
1160
Chip 5
A
1
1
0
0
0
0
0
0
1
0
0
145.01
1748
50
0.031
1059
Chip 6
A
3
3
0
0
0
0
0
0
2
0
0
149.71
1749
48
0.034
1128
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
157.46
1748
55
0.032
1396
Chip 8
A
3
1
0
0
0
0
0
2
0
0
0
143.23
1746
46
0.036
1330
Chip 9
A
6
6
0
0
0
0
0
0
5
0
0
141.83
1749
48
0.033
1276
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
161.72
1749
54
0.031
1120
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
143.09
1751
46
0.028
1232
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
153.03
1748
52
0.031
1165
Chip 13
A
6
6
0
0
0
0
0
0
6
0
0
165.73
1747
55
0.034
1110
Chip 14
A
4
3
0
0
0
0
0
1
3
0
0
143.61
1750
48
0.029
1230
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
149.19
1750
50
0.033
1300
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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