Test Date: 2015-12-08 13:26
Analysis date: 2015-12-09 11:21
M4080 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M4080
Grade Grade B
ElectricalGrade Electrical Grade A
IVGrade IV Grade B
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 27 - 16/0/0
DeadPixels Dead Pixels 3
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 12
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 12
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 1
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-12-08
TestTime Test Time 13:26
TestDuration Test Duration 1:21:34
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar prod-12
ModuleIa Module Ia 381 mA
Summary 3
Noise Noise 127.40 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 44.47 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1041.00 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.78
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 1.61 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.04 μA
CurrentVariation I(150 V) / I(100 V) 1.47
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.04 μA
Variation I(150 V) / I(100 V) 1.47
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 1.61 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.47
CurrentRatio100V I(+17C)/I(-20C) 100V 19.57
CurrentRatio150V I(+17C)/I(-20C) 150V 15.20
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:21:34
MinCurrent min. Current 0.365 A
MaxCurrent max. Current 0.545 A
Analog Current
Duration Duration 1:21:34
MinCurrent min. Current 0.074 A
MaxCurrent max. Current 0.386 A
ModuleIa Module Ia 381 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 18.90
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -20.00 +/- 0.01 °C
Duration Duration of test 0:06:32
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
137.14
1750
44
0.039
1108
Chip 1
A
5
0
0
4
0
0
0
1
0
0
0
136.95
1748
42
0.048
1038
Chip 2
A
1
0
0
0
0
0
0
1
0
0
0
142.53
1750
50
0.043
944
Chip 3
A
4
2
0
0
0
0
0
2
0
0
0
130.97
1748
46
0.040
1346
Chip 4
A
1
0
0
1
0
0
0
0
0
0
0
116.74
1750
41
0.030
1070
Chip 5
A
2
0
0
2
1
0
0
0
1
0
0
119.76
1750
42
0.037
996
Chip 6
A
1
0
0
0
0
0
0
1
0
0
0
121.13
1751
43
0.033
924
Chip 7
A
1
1
0
0
0
0
0
0
0
0
0
124.35
1750
44
0.030
1037
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
120.32
1748
41
0.030
1009
Chip 9
A
1
0
0
0
0
0
0
1
0
0
0
132.86
1750
47
0.034
1117
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
119.68
1750
42
0.034
864
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
112.52
1750
43
0.033
1077
Chip 12
A
2
0
0
2
0
0
0
0
0
0
0
108.38
1752
42
0.034
882
Chip 13
A
3
0
0
2
0
0
0
1
0
0
0
118.45
1748
44
0.034
929
Chip 14
A
5
0
0
1
0
0
0
4
0
0
0
153.29
1749
53
0.047
1120
Chip 15
A
1
0
0
0
0
0
0
1
0
0
0
143.29
1749
48
0.033
1196
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 10
nErrors # Errors 186
nWarnings # Warnings 3
channel_0_count Channel 0 26
channel_1_count Channel 1 19
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 23
message_eventid_count Event ID mismatch 9
message_readback_count Readback start marker 3
message_notokenpass_count has NoTokenPass 10
message_datasize_count Data size criticals 4
message_missingevents_count Missing Event criticals 6
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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