Test Date: 2015-09-11 11:43
Analysis date: 2015-12-09 10:48
M4080 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M4080
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 104 - 15/1/0
DeadPixels Dead Pixels 3
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 98
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 1
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-09-11
TestTime Test Time 11:43
TestDuration Test Duration 1:36:35
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-10+20 g6580e80
ModuleIa Module Ia 383.5 mA
Summary 3
Noise Noise 145.49 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 38.09 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1118.78 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.78
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.94 μA
CurrentVariation I(150 V) / I(100 V) 1.15
IVCurve
CurrentAtVoltage150V I(150 V) 0.94 μA
Variation I(150 V) / I(100 V) 1.15
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:36:35
MinCurrent min. Current 0.37 A
MaxCurrent max. Current 0.488 A
Analog Current
Duration Duration 1:36:35
MinCurrent min. Current 0.075 A
MaxCurrent max. Current 0.475 A
ModuleIa Module Ia 383.5 mA
Temperature
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
5
0
0
5
0
0
0
0
0
0
0
151.57
1750
36
0.043
1184
Chip 1
A
4
0
0
4
0
0
0
0
0
0
0
152.30
1748
36
0.048
1104
Chip 2
A
4
0
0
3
0
0
0
1
0
0
0
161.60
1746
42
0.044
995
Chip 3
A
2
2
0
0
0
0
0
0
0
0
0
130.25
1748
38
0.038
1450
Chip 4
A
1
0
0
1
0
0
0
0
0
0
0
134.96
1751
36
0.030
1190
Chip 5
A
2
0
0
1
1
0
0
1
0
0
0
144.03
1752
36
0.037
1068
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
150.17
1748
37
0.033
1026
Chip 7
A
1
1
0
0
0
0
0
0
1
0
0
139.55
1749
39
0.032
1148
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
143.73
1748
36
0.028
1095
Chip 9
A
6
0
0
5
0
0
0
1
0
0
0
138.24
1748
38
0.034
1146
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
146.52
1750
35
0.031
914
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
136.36
1748
41
0.031
1168
Chip 12
A
2
0
0
2
0
0
0
0
0
0
0
122.43
1748
36
0.033
965
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
150.26
1750
38
0.034
988
Chip 14
B
74
0
0
74
0
0
0
1
0
0
0
165.06
1750
46
0.046
1210
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
160.73
1747
41
0.033
1250
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 4
nWarnings # Warnings 0
channel_0_count Channel 0 4
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 2
message_eventid_count Event ID mismatch 2
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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