Test Date: 2015-12-08 13:26
Analysis date: 2015-12-09 10:35
M4077 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M4077
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 8 - 16/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 4
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-12-08
TestTime Test Time 13:26
TestDuration Test Duration 1:17:06
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-12
ModuleIa Module Ia 383.5 mA
Summary 3
Noise Noise 127.45 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 43.16 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1047.25 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.78
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 1.03 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.02 μA
CurrentVariation I(150 V) / I(100 V) 2.00
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.02 μA
Variation I(150 V) / I(100 V) 2.00
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 1.03 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 2.00
CurrentRatio100V I(+17C)/I(-20C) 100V 48.85
CurrentRatio150V I(+17C)/I(-20C) 150V 27.37
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:17:06
MinCurrent min. Current 0.363 A
MaxCurrent max. Current 0.558 A
Analog Current
Duration Duration 1:17:06
MinCurrent min. Current 0.075 A
MaxCurrent max. Current 0.387 A
ModuleIa Module Ia 383.5 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 18.90
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -19.99 +/- 0.03 °C
Duration Duration of test 0:05:47
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
133.63
1750
42
0.031
900
Chip 1
A
2
0
0
0
0
0
0
2
0
0
0
138.97
1745
44
0.036
827
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
121.18
1750
44
0.032
1198
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
143.66
1749
44
0.034
1030
Chip 4
A
2
0
0
2
0
0
0
0
0
0
0
116.19
1747
42
0.035
1010
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
134.57
1748
43
0.033
1032
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
106.50
1750
41
0.031
1063
Chip 7
A
2
0
0
1
0
0
0
1
0
0
0
142.34
1748
44
0.030
1120
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
116.40
1748
44
0.031
902
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
134.03
1748
46
0.034
1104
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
142.14
1750
46
0.028
1176
Chip 11
A
1
0
0
0
0
0
0
1
0
0
0
117.20
1746
42
0.032
1010
Chip 12
A
1
0
0
1
0
0
0
0
0
0
0
136.34
1750
44
0.030
1147
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
124.90
1748
40
0.035
902
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
120.08
1749
42
0.034
1207
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
111.04
1748
43
0.032
1126
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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