Test Date: 2015-12-08 13:26
Analysis date: 2015-12-09 11:11
M4076 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M4076
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 30 - 16/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 27
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 2
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-12-08
TestTime Test Time 13:26
TestDuration Test Duration 1:19:16
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-12
ModuleIa Module Ia 387.5 mA
Summary 3
Noise Noise 142.88 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 44.84 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1081.81 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.77
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 1.22 μA
CurrentVariation I(150 V) / I(100 V) 1.35
IVCurve
CurrentAtVoltage150V I(150 V) 1.22 μA
Variation I(150 V) / I(100 V) 1.35
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:19:16
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.47 A
Analog Current
Duration Duration 1:19:16
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.392 A
ModuleIa Module Ia 387.5 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.05
Min min 18.50
Max max 19.30
Temperature
Temperature Temp. while test 17.00 +/- 0.05 °C
Duration Duration of test 1:19:15
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
0
0
0
1
0
0
0
1
0
0
138.76
1752
48
0.037
1134
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
144.69
1750
48
0.031
1128
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
152.72
1750
47
0.031
1168
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
144.24
1748
46
0.033
1108
Chip 4
A
1
1
0
0
0
0
0
0
1
0
0
146.14
1749
45
0.028
960
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
152.72
1748
44
0.030
982
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
133.04
1747
41
0.038
923
Chip 7
A
11
0
0
11
0
0
0
0
0
0
0
139.36
1749
42
0.028
1206
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
150.07
1747
44
0.031
1176
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
143.64
1752
44
0.031
928
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
134.13
1751
46
0.030
1137
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
146.34
1751
48
0.037
1298
Chip 12
A
1
0
0
1
0
0
0
0
0
0
0
131.95
1749
44
0.032
830
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
140.17
1750
45
0.032
996
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
152.30
1751
44
0.029
1113
Chip 15
A
13
0
0
13
0
0
0
0
0
0
0
135.77
1755
42
0.034
1224
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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