Test Date: 2015-12-08 13:26
Analysis date: 2015-12-09 11:11
M4076 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M4076
Grade Grade B
ElectricalGrade Electrical Grade A
IVGrade IV Grade B
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 26 - 16/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 23
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 2
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-12-08
TestTime Test Time 13:26
TestDuration Test Duration 1:19:59
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-12
ModuleIa Module Ia 390.7 mA
Summary 3
Noise Noise 129.54 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 43.41 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1012.41 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.80
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 9.89 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.22 μA
CurrentVariation I(150 V) / I(100 V) 1.86
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.22 μA
Variation I(150 V) / I(100 V) 1.86
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 9.89 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.86
CurrentRatio100V I(+17C)/I(-20C) 100V 7.63
CurrentRatio150V I(+17C)/I(-20C) 150V 5.54
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:19:59
MinCurrent min. Current 0.362 A
MaxCurrent max. Current 0.548 A
Analog Current
Duration Duration 1:19:59
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.395 A
ModuleIa Module Ia 390.7 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.25
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -20.00 +/- 0.02 °C
Duration Duration of test 1:22:03
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
0
0
0
1
0
0
0
1
0
0
131.79
1749
46
0.036
1072
Chip 1
A
1
0
0
0
0
0
0
1
0
0
0
140.32
1749
46
0.028
1067
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
143.84
1750
45
0.028
1078
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
141.75
1749
44
0.034
1046
Chip 4
A
1
1
0
0
0
0
0
0
1
0
0
129.43
1750
42
0.031
875
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
134.95
1750
43
0.030
909
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
101.60
1749
38
0.038
860
Chip 7
A
12
0
0
12
0
0
0
0
0
0
0
130.04
1750
41
0.029
1138
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
136.67
1750
43
0.030
1120
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
122.78
1745
42
0.028
875
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
133.94
1750
44
0.031
1058
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
147.34
1748
48
0.038
1252
Chip 12
A
1
0
0
1
0
0
0
0
0
0
0
106.08
1749
44
0.032
758
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
114.51
1750
42
0.032
935
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
130.64
1749
42
0.029
1052
Chip 15
A
8
0
0
8
0
0
0
0
0
0
0
126.97
1750
43
0.034
1106
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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