Test Date: 2015-11-12 10:21
Analysis date: 2015-12-09 10:59
M4076 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M4076
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 54 - 16/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 2
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 50
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 2
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-11-12
TestTime Test Time 10:21
TestDuration Test Duration 1:15:05
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-10+20 g6580e80
ModuleIa Module Ia 384.3 mA
Summary 3
Noise Noise 128.52 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 46.75 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1002.16 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.81
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:15:05
MinCurrent min. Current 0.365 A
MaxCurrent max. Current 0.543 A
Analog Current
Duration Duration 1:15:05
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.481 A
ModuleIa Module Ia 384.3 mA
Temperature
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
0
0
1
1
0
0
0
1
0
0
131.93
1749
50
0.036
1068
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
140.30
1750
50
0.028
1048
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
143.43
1752
48
0.031
1058
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
141.27
1750
48
0.034
1029
Chip 4
A
1
1
0
0
0
0
0
0
1
0
0
128.87
1750
44
0.031
874
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
130.41
1752
47
0.032
884
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
102.05
1749
44
0.039
856
Chip 7
A
31
0
0
31
0
0
0
0
0
0
0
127.52
1749
46
0.032
1123
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
136.26
1749
48
0.031
1112
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
121.48
1749
44
0.031
866
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
135.59
1748
50
0.032
1044
Chip 11
A
1
0
0
0
0
0
0
1
0
0
0
149.25
1750
50
0.038
1244
Chip 12
A
1
0
0
1
0
0
0
0
0
0
0
103.21
1750
44
0.032
759
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
113.78
1750
46
0.030
937
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
126.01
1749
46
0.029
1038
Chip 15
A
16
0
0
16
0
0
0
0
0
0
0
124.96
1749
46
0.035
1094
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 4
nWarnings # Warnings 0
channel_0_count Channel 0 4
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 2
message_eventid_count Event ID mismatch 2
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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