Test Date: 2015-08-10 13:35
Analysis date: 2015-11-23 20:19
M4570 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M4570
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 18 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 12
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 2
PHGainDefects PH Gain Defects 2
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-10
TestTime Test Time 13:35
TestDuration Test Duration 1:53:27
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 383.5 mA
Summary 3
Noise Noise 148.82 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 57.91 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1149.12 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.72
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.34 μA
CurrentVariation I(150 V) / I(100 V) 1.15
IVCurve
CurrentAtVoltage150V I(150 V) 0.34 μA
Variation I(150 V) / I(100 V) 1.15
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:53:27
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.469 A
Analog Current
Duration Duration 1:53:27
MinCurrent min. Current 0.073 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 383.5 mA
Temperature
Temperature Temp. while test 17.01 +/- 0.15 °C
Duration Duration of test 2:33:52
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
2
0
0
0
0
0
0
0
0
0
141.86
1756
58
0.034
1231
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
132.35
1756
56
0.031
1152
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
155.76
1755
56
0.031
1156
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
137.98
1758
61
0.031
1061
Chip 4
A
4
1
0
0
0
0
0
3
0
0
0
157.75
1756
59
0.028
987
Chip 5
A
1
0
0
0
0
0
0
1
0
0
0
147.43
1758
61
0.033
1350
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
157.82
1757
57
0.031
1167
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
161.93
1757
58
0.031
1218
Chip 8
A
2
1
0
0
0
0
0
1
1
0
0
150.80
1752
60
0.036
1234
Chip 9
A
3
1
0
2
2
0
0
1
1
0
0
138.26
1756
54
0.034
1101
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
147.04
1756
55
0.031
1156
Chip 11
A
2
0
0
0
0
0
0
2
0
0
0
158.57
1756
60
0.028
1153
Chip 12
A
2
0
0
0
0
0
0
2
0
0
0
159.96
1757
62
0.032
1190
Chip 13
A
1
0
0
0
0
0
0
1
0
0
0
143.37
1757
58
0.034
1068
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
146.62
1756
57
0.030
1145
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
143.64
1750
54
0.034
1017
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 1
nErrors # Errors 22
nWarnings # Warnings 51
channel_0_count Channel 0 40
channel_1_count Channel 1 33
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 16
message_eventid_count Event ID mismatch 6
message_readback_count Readback start marker 51
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 1
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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