Test Date: 2015-08-10 13:35
Analysis date: 2015-11-23 20:19
M4570 ModuleFulltest_m20_2
Chips

Overview

_
Summary 1
Module Module M4570
Grade Grade B
ElectricalGrade Electrical Grade A
IVGrade IV Grade B
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 20 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 15
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 1
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-10
TestTime Test Time 13:35
TestDuration Test Duration 1:54:24
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 381 mA
Summary 3
Noise Noise 142.63 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.59 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1076.91 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.76
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 1.07 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.02 μA
CurrentVariation I(150 V) / I(100 V) 1.64
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.02 μA
Variation I(150 V) / I(100 V) 1.64
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 1.07 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.64
CurrentRatio100V I(+17C)/I(-20C) 100V 20.28
CurrentRatio150V I(+17C)/I(-20C) 150V 14.31
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:54:24
MinCurrent min. Current 0.362 A
MaxCurrent max. Current 0.539 A
Analog Current
Duration Duration 1:54:24
MinCurrent min. Current 0.073 A
MaxCurrent max. Current 0.385 A
ModuleIa Module Ia 381 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.06 °C
Duration Duration of test 1:57:56
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
2
0
0
0
0
0
0
0
0
0
150.13
1758
56
0.033
1164
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
140.07
1755
54
0.034
1089
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
132.60
1753
53
0.031
1072
Chip 3
A
3
0
0
0
0
0
0
3
0
0
0
143.86
1757
60
0.031
1009
Chip 4
A
2
1
0
0
0
0
0
1
0
0
0
144.36
1755
56
0.031
912
Chip 5
A
1
0
0
0
0
0
0
1
0
0
0
145.03
1756
61
0.033
1279
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
134.80
1753
55
0.030
1122
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
149.29
1754
55
0.031
1113
Chip 8
A
3
1
0
0
0
0
0
2
1
0
0
155.37
1754
58
0.036
1176
Chip 9
A
3
1
0
2
1
0
0
2
0
0
0
122.89
1749
53
0.034
1050
Chip 10
A
5
0
0
0
0
0
0
5
0
0
0
131.88
1755
66
0.031
1070
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
152.67
1755
60
0.030
1064
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
157.58
1755
58
0.033
1132
Chip 13
A
1
0
0
0
0
0
0
1
0
0
0
146.84
1754
57
0.036
996
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
144.05
1752
56
0.030
1070
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
130.69
1753
50
0.032
912
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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