Test Date: 2015-08-10 13:35
Analysis date: 2015-11-23 20:19
M4570 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M4570
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 9 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 2
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 3
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-10
TestTime Test Time 13:35
TestDuration Test Duration 1:52:37
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 390.7 mA
Summary 3
Noise Noise 139.35 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.47 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1075.28 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.76
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:52:37
MinCurrent min. Current 0.362 A
MaxCurrent max. Current 0.536 A
Analog Current
Duration Duration 1:52:37
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.395 A
ModuleIa Module Ia 390.7 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.06 °C
Duration Duration of test 1:57:07
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
2
0
0
0
0
0
0
0
0
0
142.24
1755
55
0.033
1162
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
129.72
1755
56
0.034
1088
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
132.44
1754
54
0.031
1072
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
139.93
1756
57
0.031
1002
Chip 4
A
2
1
0
0
0
0
0
1
0
0
0
143.59
1756
56
0.029
918
Chip 5
A
1
0
0
0
0
0
0
1
0
0
0
142.51
1754
60
0.033
1285
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
139.08
1750
55
0.030
1120
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
147.04
1750
56
0.031
1112
Chip 8
A
1
1
0
0
0
0
0
0
1
0
0
148.14
1752
55
0.035
1178
Chip 9
A
3
1
0
2
0
0
0
0
2
0
0
124.21
1758
54
0.034
1037
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
130.05
1754
52
0.031
1061
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
152.48
1756
57
0.030
1064
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
149.02
1757
58
0.033
1128
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
142.99
1755
56
0.034
991
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
143.87
1752
55
0.028
1074
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
122.30
1752
51
0.032
913
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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