Test Date: 2015-11-20 08:13
Analysis date: 2015-11-23 18:13
M4570 ModuleFulltestPxar_m20_1
Chips

Overview

_
Summary 1
Module Module M4570
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 14 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 8
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 1
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-11-20
TestTime Test Time 08:13
TestDuration Test Duration 1:32:29
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 385.1 mA
Summary 3
Noise Noise 138.74 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.72 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1074.81 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.77
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:32:29
MinCurrent min. Current 0.362 A
MaxCurrent max. Current 0.531 A
Analog Current
Duration Duration 1:32:29
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.389 A
ModuleIa Module Ia 385.1 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 18.95
Min min 17.70
Max max 19.30
Temperature
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
2
0
0
0
0
0
0
0
0
0
141.59
1752
46
0.035
1162
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
128.49
1749
46
0.034
1088
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
132.54
1750
46
0.029
1080
Chip 3
A
1
0
0
0
0
0
1
0
0
0
0
139.73
1750
49
0.032
1004
Chip 4
A
2
1
0
0
0
0
0
1
0
0
0
141.41
1750
45
0.028
909
Chip 5
A
1
0
0
0
0
0
0
1
0
0
0
141.34
1752
50
0.034
1285
Chip 6
A
1
0
0
0
0
0
0
1
0
0
0
135.96
1751
46
0.030
1119
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
148.51
1750
44
0.033
1126
Chip 8
A
1
1
0
0
0
0
0
0
1
0
0
150.93
1750
45
0.035
1184
Chip 9
A
3
1
0
2
0
0
0
2
0
0
0
122.75
1752
43
0.032
1042
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
129.59
1750
44
0.031
1062
Chip 11
A
3
0
0
0
0
0
0
3
0
0
0
151.56
1752
50
0.030
1068
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
156.32
1752
46
0.032
1124
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
146.31
1750
45
0.035
996
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
142.99
1751
45
0.030
1044
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
109.89
1752
42
0.032
906
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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