Test Date: 2015-08-04 12:20
Analysis date: 2015-11-23 20:07
M4562 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M4562
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 23 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 17
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-04
TestTime Test Time 12:20
TestDuration Test Duration 2:00:20
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 381.9 mA
Summary 3
Noise Noise 147.98 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 57.72 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1246.03 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.73
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.33 μA
CurrentVariation I(150 V) / I(100 V) 1.12
IVCurve
CurrentAtVoltage150V I(150 V) 0.33 μA
Variation I(150 V) / I(100 V) 1.12
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 2:00:20
MinCurrent min. Current 0.358 A
MaxCurrent max. Current 0.466 A
Analog Current
Duration Duration 2:00:20
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.385 A
ModuleIa Module Ia 381.9 mA
Temperature
Temperature Temp. while test 17.02 +/- 0.17 °C
Duration Duration of test 2:00:26
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
142.06
1760
56
0.037
1215
Chip 1
A
5
0
0
0
0
0
0
5
0
0
0
165.55
1757
62
0.040
1261
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
136.41
1759
57
0.034
1526
Chip 3
A
2
0
0
0
0
0
0
2
0
0
0
142.56
1755
57
0.037
1130
Chip 4
A
1
0
0
0
0
0
0
1
0
0
0
155.99
1757
60
0.036
1232
Chip 5
A
2
0
0
0
0
0
0
2
0
0
0
153.56
1760
61
0.029
1034
Chip 6
A
1
0
0
0
0
0
0
1
0
0
0
152.82
1755
56
0.036
1258
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
140.12
1757
60
0.031
1286
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
151.39
1758
60
0.034
1272
Chip 9
A
6
5
0
1
1
0
0
0
5
0
0
139.55
1755
52
0.034
912
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
159.67
1758
56
0.028
1294
Chip 11
A
2
0
0
0
0
0
0
2
0
0
0
138.73
1753
53
0.035
1396
Chip 12
A
3
0
0
0
0
0
0
3
0
0
0
155.58
1760
62
0.039
1256
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
138.67
1757
56
0.033
1188
Chip 14
A
1
0
0
0
0
0
0
1
0
0
0
152.80
1754
58
0.033
1314
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
142.19
1756
57
0.038
1360
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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