Test Date: 2015-08-04 12:20
Analysis date: 2015-11-23 20:07
M4562 ModuleFulltest_m20_2
Chips

Overview

_
Summary 1
Module Module M4562
Grade Grade B
ElectricalGrade Electrical Grade A
IVGrade IV Grade B
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 16 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 10
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-04
TestTime Test Time 12:20
TestDuration Test Duration 2:00:05
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 385.9 mA
Summary 3
Noise Noise 137.73 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.81 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1151.19 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.76
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.84 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.02 μA
CurrentVariation I(150 V) / I(100 V) 1.22
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.02 μA
Variation I(150 V) / I(100 V) 1.22
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.84 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.22
CurrentRatio100V I(+17C)/I(-20C) 100V 19.27
CurrentRatio150V I(+17C)/I(-20C) 150V 17.67
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 2:00:05
MinCurrent min. Current 0.359 A
MaxCurrent max. Current 0.535 A
Analog Current
Duration Duration 2:00:05
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.389 A
ModuleIa Module Ia 385.9 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.06 °C
Duration Duration of test 2:00:09
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
137.10
1752
54
0.039
1134
Chip 1
A
2
0
0
0
0
0
0
2
0
0
0
143.64
1756
58
0.041
1136
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
128.61
1756
58
0.035
1438
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
141.77
1752
55
0.037
1026
Chip 4
A
1
0
0
0
0
0
0
1
0
0
0
144.86
1754
56
0.037
1158
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
140.60
1755
56
0.030
951
Chip 6
A
1
0
0
0
0
0
0
1
0
0
0
143.52
1754
57
0.037
1133
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
128.83
1756
58
0.031
1214
Chip 8
A
2
0
0
0
0
0
0
2
0
0
0
147.71
1754
59
0.037
1199
Chip 9
A
6
5
0
1
0
0
0
0
5
0
0
122.94
1752
52
0.035
824
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
135.56
1754
54
0.028
1196
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
127.11
1752
50
0.033
1292
Chip 12
A
3
0
0
0
0
0
0
3
0
0
0
155.39
1757
62
0.040
1181
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
126.12
1756
54
0.036
1078
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
143.07
1755
55
0.032
1202
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
136.86
1753
56
0.039
1255
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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