Test Date: 2015-08-04 12:20
Analysis date: 2015-11-23 20:07
M4562 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M4562
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 22 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 15
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-04
TestTime Test Time 12:20
TestDuration Test Duration 1:58:15
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 381.9 mA
Summary 3
Noise Noise 138.32 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.00 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1153.53 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.77
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:58:15
MinCurrent min. Current 0.358 A
MaxCurrent max. Current 0.532 A
Analog Current
Duration Duration 1:58:15
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.385 A
ModuleIa Module Ia 381.9 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.06 °C
Duration Duration of test 1:58:20
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
136.51
1753
53
0.040
1140
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
144.58
1756
60
0.041
1143
Chip 2
A
1
0
0
0
0
0
0
1
0
0
0
129.00
1757
58
0.038
1435
Chip 3
A
2
0
0
0
0
0
0
2
0
0
0
142.43
1754
55
0.037
1044
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
144.98
1755
56
0.035
1148
Chip 5
A
1
0
0
0
0
0
0
1
0
0
0
141.87
1755
57
0.032
947
Chip 6
A
1
0
0
0
0
0
0
1
0
0
0
142.88
1754
56
0.037
1136
Chip 7
A
2
0
0
0
0
0
0
2
0
0
0
129.39
1753
57
0.031
1226
Chip 8
A
3
0
0
0
0
0
0
3
0
0
0
145.05
1752
58
0.037
1198
Chip 9
A
6
5
0
1
0
0
0
0
5
0
0
124.64
1752
52
0.034
822
Chip 10
A
1
0
0
0
0
0
1
0
0
0
0
134.05
1752
54
0.029
1195
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
127.31
1753
52
0.035
1296
Chip 12
A
4
0
0
0
0
0
0
4
0
0
0
159.38
1756
62
0.040
1184
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
128.68
1752
55
0.036
1089
Chip 14
A
1
0
0
0
0
0
0
1
0
0
0
145.07
1754
56
0.032
1197
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
137.24
1753
55
0.040
1255
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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