Test Date: 2015-08-04 12:20
Analysis date: 2015-11-23 19:53
M4560 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M4560
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 6 - 16/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 6
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 0
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-08-04
TestTime Test Time 12:20
TestDuration Test Duration 1:54:41
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+36 geb5ac3f
ModuleIa Module Ia 387.5 mA
Summary 3
Noise Noise 145.66 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 57.56 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1261.47 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.72
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.34 μA
CurrentVariation I(150 V) / I(100 V) 1.09
IVCurve
CurrentAtVoltage150V I(150 V) 0.34 μA
Variation I(150 V) / I(100 V) 1.09
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:54:41
MinCurrent min. Current 0.356 A
MaxCurrent max. Current 0.465 A
Analog Current
Duration Duration 1:54:41
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.391 A
ModuleIa Module Ia 387.5 mA
Temperature
Temperature Temp. while test 17.02 +/- 0.17 °C
Duration Duration of test 2:00:26
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
131.08
1757
57
0.031
1018
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
141.23
1757
62
0.027
1413
Chip 2
A
1
0
0
0
0
0
0
1
0
0
0
148.01
1757
56
0.031
1220
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
131.81
1753
53
0.030
1308
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
151.23
1757
60
0.035
1167
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
152.79
1755
56
0.028
1336
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
159.61
1759
58
0.030
1424
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
151.92
1757
57
0.034
1090
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
130.38
1756
54
0.034
1182
Chip 9
A
2
0
0
0
0
0
0
2
0
0
0
148.81
1758
60
0.034
1242
Chip 10
A
1
0
0
0
0
0
0
1
0
0
0
157.65
1754
60
0.033
1345
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
140.41
1758
58
0.033
1352
Chip 12
A
2
0
0
0
0
0
0
2
0
0
0
154.29
1757
57
0.030
1138
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
148.34
1757
60
0.038
1326
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
136.94
1755
56
0.028
1250
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
146.14
1757
56
0.030
1374
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 2
nErrors # Errors 3399
nWarnings # Warnings 261
channel_0_count Channel 0 1888
channel_1_count Channel 1 1772
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1696
message_eventid_count Event ID mismatch 1703
message_readback_count Readback start marker 261
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 2
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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