Test Date: 2015-08-14 16:47
Analysis date: 2015-11-23 19:39
M4553 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M4553
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 23 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 14
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 3
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 4
PHGainDefects PH Gain Defects 3
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center Aachen
TestDate Test Date 2015-08-14
TestTime Test Time 16:47
TestDuration Test Duration 1:55:20
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+69 g35a931b
ModuleIa Module Ia 385.1 mA
Summary 3
Noise Noise 148.21 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 58.22 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1327.09 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.66
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.43 μA
CurrentVariation I(150 V) / I(100 V) 1.11
IVCurve
CurrentAtVoltage150V I(150 V) 0.43 μA
Variation I(150 V) / I(100 V) 1.11
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:55:20
MinCurrent min. Current 0.365 A
MaxCurrent max. Current 0.475 A
Analog Current
Duration Duration 1:55:20
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 385.1 mA
Temperature
Temperature Temp. while test 17.00 +/- 0.12 °C
Duration Duration of test 1:53:10
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
140.99
1757
55
0.033
1274
Chip 1
A
2
0
0
2
2
0
0
1
1
0
0
153.32
1757
57
0.044
1230
Chip 2
A
2
0
0
0
0
0
0
2
0
0
0
156.45
1757
58
0.034
1334
Chip 3
A
12
3
0
0
1
0
0
8
1
0
0
133.90
1752
62
0.031
1460
Chip 4
A
2
2
0
0
0
0
0
0
1
0
0
145.70
1756
56
0.029
1464
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
157.31
1761
58
0.036
1270
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
152.77
1758
56
0.030
1241
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
156.70
1755
60
0.027
1283
Chip 8
A
2
0
0
1
0
0
0
1
0
0
0
148.94
1759
60
0.030
1392
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
158.30
1758
64
0.064
1510
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
145.74
1756
57
0.038
1343
Chip 11
A
2
0
0
0
1
0
0
1
0
0
0
139.32
1755
58
0.033
1128
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
148.86
1756
57
0.073
1442
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
136.67
1754
55
0.028
1132
Chip 14
A
1
0
0
0
0
0
0
1
0
0
0
158.41
1757
60
0.030
1338
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
138.03
1758
58
0.028
1392
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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