Test Date: 2015-08-14 16:47
Analysis date: 2015-11-23 19:39
M4553 ModuleFulltest_m20_2
Chips

Overview

_
Summary 1
Module Module M4553
Grade Grade B
ElectricalGrade Electrical Grade A
IVGrade IV Grade B
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 17 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 10
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 3
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 2
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center Aachen
TestDate Test Date 2015-08-14
TestTime Test Time 16:47
TestDuration Test Duration 1:57:35
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+69 g35a931b
ModuleIa Module Ia 385.1 mA
Summary 3
Noise Noise 138.82 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.75 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1218.94 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.70
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 1.11 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.02 μA
CurrentVariation I(150 V) / I(100 V) 1.32
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.02 μA
Variation I(150 V) / I(100 V) 1.32
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 1.11 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.32
CurrentRatio100V I(+17C)/I(-20C) 100V 21.11
CurrentRatio150V I(+17C)/I(-20C) 150V 17.69
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:57:35
MinCurrent min. Current 0.367 A
MaxCurrent max. Current 0.529 A
Analog Current
Duration Duration 1:57:35
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.389 A
ModuleIa Module Ia 385.1 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.06 °C
Duration Duration of test 1:57:40
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
0
0
0
0
0
0
1
0
0
0
143.36
1756
56
0.033
1164
Chip 1
A
4
0
0
2
1
0
0
4
0
0
0
127.39
1754
55
0.046
1136
Chip 2
A
2
0
0
0
0
0
0
2
0
0
0
141.12
1753
55
0.033
1198
Chip 3
A
4
3
0
0
0
0
0
0
1
0
0
135.23
1752
52
0.030
1306
Chip 4
A
2
2
0
0
0
0
0
0
1
0
0
130.46
1752
54
0.030
1352
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
132.48
1756
54
0.035
1160
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
130.61
1752
52
0.031
1098
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
147.98
1752
56
0.029
1140
Chip 8
A
2
0
0
1
0
0
0
1
0
0
0
141.28
1757
58
0.032
1304
Chip 9
A
1
0
0
0
0
0
0
1
0
0
0
156.59
1757
62
0.062
1412
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
141.30
1755
57
0.040
1238
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
134.50
1755
57
0.034
1054
Chip 12
A
1
0
0
0
0
0
0
1
0
0
0
152.35
1754
58
0.072
1378
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
135.29
1754
52
0.030
1025
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
135.09
1754
58
0.030
1230
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
136.04
1755
55
0.028
1308
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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