Test Date: 2015-08-14 16:47
Analysis date: 2015-11-23 19:39
M4553 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M4553
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 17 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 8
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 3
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center Aachen
TestDate Test Date 2015-08-14
TestTime Test Time 16:47
TestDuration Test Duration 1:58:50
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar prod-01+69 g35a931b
ModuleIa Module Ia 385.1 mA
Summary 3
Noise Noise 138.95 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.06 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1220.06 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.70
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:58:50
MinCurrent min. Current 0.367 A
MaxCurrent max. Current 0.53 A
Analog Current
Duration Duration 1:58:50
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 385.1 mA
Temperature
Temperature Temp. while test -20.01 +/- 0.06 °C
Duration Duration of test 1:58:54
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
0
0
0
0
0
0
0
0
0
0
0
144.33
1753
52
0.033
1170
Chip 1
A
2
0
0
2
0
0
0
0
2
0
0
127.59
1755
56
0.044
1136
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
139.35
1753
54
0.033
1195
Chip 3
A
4
3
0
0
0
0
0
0
1
0
0
135.27
1754
51
0.029
1316
Chip 4
A
2
2
0
0
0
0
0
0
1
0
0
132.64
1753
52
0.030
1354
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
132.98
1756
55
0.038
1161
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
129.66
1754
54
0.031
1090
Chip 7
A
1
0
0
0
0
0
0
1
0
0
0
146.64
1755
58
0.029
1142
Chip 8
A
1
0
0
1
0
0
0
0
0
0
0
140.03
1758
60
0.031
1299
Chip 9
A
1
0
0
0
0
0
0
1
0
0
0
156.32
1756
58
0.061
1402
Chip 10
A
2
0
0
0
0
0
0
2
0
0
0
147.41
1755
56
0.042
1242
Chip 11
A
1
0
0
0
0
0
0
1
0
0
0
136.20
1754
57
0.034
1066
Chip 12
A
1
0
0
0
0
0
0
1
0
0
0
148.10
1756
57
0.072
1371
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
135.14
1752
54
0.029
1034
Chip 14
A
2
0
0
0
0
0
0
2
0
0
0
136.28
1754
55
0.030
1226
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
135.23
1754
53
0.028
1314
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 0
message_eventid_count Event ID mismatch 0
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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