Grading Criteria

Below are the grading criteria for the module 
production: If a module does not classify for A,
check whether it fulfills the requirements for B.
If it doesn't, then it's C.

(A: for use, B: spare, C: not used)


Defects
A: < 1% defects / chip  
B: < 4% defects / chip 
C: > 4% defects / chip  


A*: A if there are mask defects
B*: B if there are mask defects


IV based at T = 17 C

T = 17 C measured
A: I(150V) < 2 muA 
B: I(150V) < 10 muA
C: I(150V) > 10 muA 

T = -10 C recalculated to 17 C
A: I(150V) < 3 muA 
B: I(150V) < 15 muA
C: I(150V) > 15 muA 

A: IV-Slope < 2 
B: IV-Slope > 2 


Qualification parameters
A: Noise                < 500 e-
   Vcal Threshold Width < 200 e-   (~ 3 DAC)
   Relative Gain Width  < 10%      
   Pedestal Spread      < 2500 e-  (~ 70 ADC)

B: Noise                < 1000 e-
   Vcal Threshold Width < 400 e-   (~ 6 DAC)
   Relative Gain Width  < 20%      
   Pedestal Spread      < 5000 e-  (~ 140 ADC)

C: Noise                > 1000 e-
   Vcal Threshold Width > 400 e-   (~ 6 DAC)
   Relative Gain Width  > 20%      
   Pedestal Spread      > 5000 e-  (~ 140 ADC)


NOTE: The alert level (= comment in summary table) 
is set lower in some cases. The current settings
for a comment on a chip to appear, are 

Noise                < 250 e-
Vcal Threshold Width < 2 DAC
Relative Gain Width  < 10%      
Pedestal Spread      < 2000 e-