Test Date: 2015-03-24 21:03
R0306 ModuleFullTestPyxar_m20_1
Chips

Overview

_
Vcal Threshold
Summary 1
Module Module R0306
Grade Grade A
PixelDefects Pixel Defects - A/B/C 32 - 1/0/0
DeadPixels Dead Pixels 6
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 37
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 24
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 37
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-03-24
TestTime Test Time 21:03
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 99.79 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 120.50 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.08 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 2322.00 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.97
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 15.44 μA
CurrentVariation I(150 V) / I(100 V) 1.37
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 15.44 μA
Variation I(150 V) / I(100 V) 1.37
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 0.00
Noise
mu μ 99.79
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 2322.00
Parameter1
mu μ 0.97
Temperature
Temperature Temp. while test -20.00 +/- 0.04 °C
Duration Duration of test 0:05:58
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 32 6 0 24 3 0 0 37 0 0 0
_