Test Date: 2016-07-28 11:58
Analysis date: 2016-07-28 13:14
M3212 ModuleReceptionTest_p17_1
Chips

Overview

Pixel Alive Map
Summary
Module Module M3212
Grade Grade C
ManualGrade Manual grade -
ElectricalGrade Electrical Grade A
IVGrade IV Grade C
DeadPixels Dead Pixels 15
DefectiveBumps Bump Defects 0
DefectiveBumpsMax Max BumpDef/ROC 0
DeadPixelsMax Max Dead Pixels/ROC 12
Readback Readback calibration ok
Bump Bonding Defects Map
IanaLoss
Plot
IanaLossProblems Iana problems No
Mean mean 19.60
Min min 18.50
Max max 20.10
NROCsNotProgrammable ROCs not programmable 0
Bump Bonding Thrmap
IVCurve
Plot
CurrentAtVoltage150V I(150 V) 16.17 μA
Variation I(150 V) / I(100 V) 1.78
IV150DB I(150 V) Fulltest 0.18 μA
ReadbackStatus
Plot
ModuleCalibrationGood Readback Calibration ok
ReadbackExplanation Colors Red means not calibrated or parameter value outside of bulk distribution
Logfile

Overview

Database comparison
FULLMODULE_ID GRADE BAREMODULE_ID HDI_ID SENSOR_ID BUILTON BUILTBY STATUS tempnominal I150 IVSLOPE PIXELDEFECTS
M3212 B B350856-05-2 1159-06-0005 S350856-05-2 2016-05-25 15:10:47 CERN INSTOCK m20_1 2e-08 2.32 16
M3212 A B350856-05-2 1159-06-0005 S350856-05-2 2016-05-25 15:10:47 CERN INSTOCK m20_2 2e-08 1.96 20
M3212 A B350856-05-2 1159-06-0005 S350856-05-2 2016-05-25 15:10:47 CERN INSTOCK p17_1 1.8e-07 1.23 16
Database comparison - Pixel Defects
Total Dead Bump
C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15 C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15
Reception 15 15 0 0 0 0 0 0 0 12 3 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Database 16 15 0 0 0 0 0 0 0 12 3 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
MoReWeb-v1.0.2-10-gbc52a17 on branch master