Test Date: 2016-07-06 10:02
Analysis date: 2016-07-26 21:22
M3178 ModuleReceptionTest_p17_1
Chips
Overview
Summary
Module |
Module |
M3178 |
|
Grade |
Grade |
A |
|
ManualGrade |
Manual grade |
- |
|
ElectricalGrade |
Electrical Grade |
A |
|
IVGrade |
IV Grade |
A |
|
DeadPixels |
Dead Pixels |
4 |
|
DefectiveBumps |
Bump Defects |
3 |
|
DefectiveBumpsMax |
Max BumpDef/ROC |
1 |
|
DeadPixelsMax |
Max Dead Pixels/ROC |
3 |
|
Readback |
Readback calibration |
ok |
|
IanaLoss
IanaLossProblems |
Iana problems |
No |
|
Mean |
mean |
19.80 |
|
Min |
min |
18.50 |
|
Max |
max |
20.90 |
|
NROCsNotProgrammable |
ROCs not programmable |
0 |
|
IVCurve
CurrentAtVoltage150V |
I(150 V) |
0.26 |
μA |
Variation |
I(150 V) / I(100 V) |
1.07 |
|
IV150DB |
I(150 V) Fulltest |
0.23 |
μA |
ReadbackStatus
ModuleCalibrationGood |
Readback Calibration |
ok |
|
ReadbackExplanation |
Colors |
Red means not calibrated or parameter value outside of bulk distribution |
|
Database comparison
FULLMODULE_ID
|
GRADE
|
BAREMODULE_ID
|
HDI_ID
|
SENSOR_ID
|
BUILTON
|
BUILTBY
|
STATUS
|
tempnominal
|
I150
|
IVSLOPE
|
PIXELDEFECTS
|
M3178
|
A
|
B350855-02-2
|
549-20-006
|
S350855-02-2
|
2016-01-22 18:12:14
|
CERN
|
INSTOCK
|
m20_1
|
1e-08
|
1.08
|
11
|
M3178
|
A
|
B350855-02-2
|
549-20-006
|
S350855-02-2
|
2016-01-22 18:12:14
|
CERN
|
INSTOCK
|
m20_2
|
1e-08
|
1.08
|
9
|
M3178
|
A
|
B350855-02-2
|
549-20-006
|
S350855-02-2
|
2016-01-22 18:12:14
|
CERN
|
INSTOCK
|
p17_1
|
2.3e-07
|
1.06
|
23
|
Database comparison - Pixel Defects
MoReWeb-v1.0.2-10-gbc52a17 on branch master