Test Date: 2016-07-26 16:36
Analysis date: 2016-07-26 17:02
M3172 ModuleReceptionTest_p17_1
Chips
Overview
Summary
Module |
Module |
M3172 |
|
Grade |
Grade |
A |
|
ManualGrade |
Manual grade |
- |
|
ElectricalGrade |
Electrical Grade |
A |
|
IVGrade |
IV Grade |
A |
|
DeadPixels |
Dead Pixels |
13 |
|
DefectiveBumps |
Bump Defects |
9 |
|
DefectiveBumpsMax |
Max BumpDef/ROC |
4 |
|
DeadPixelsMax |
Max Dead Pixels/ROC |
9 |
|
Readback |
Readback calibration |
ok |
|
IanaLoss
IanaLossProblems |
Iana problems |
No |
|
Mean |
mean |
18.85 |
|
Min |
min |
18.50 |
|
Max |
max |
20.10 |
|
NROCsNotProgrammable |
ROCs not programmable |
0 |
|
IVCurve
CurrentAtVoltage150V |
I(150 V) |
0.11 |
μA |
Variation |
I(150 V) / I(100 V) |
1.14 |
|
IV150DB |
I(150 V) Fulltest |
0.11 |
μA |
ReadbackStatus
ModuleCalibrationGood |
Readback Calibration |
ok |
|
ReadbackExplanation |
Colors |
Red means not calibrated or parameter value outside of bulk distribution |
|
Database comparison
FULLMODULE_ID
|
GRADE
|
BAREMODULE_ID
|
HDI_ID
|
SENSOR_ID
|
BUILTON
|
BUILTBY
|
STATUS
|
tempnominal
|
I150
|
IVSLOPE
|
PIXELDEFECTS
|
M3172
|
A
|
B350853-17-1
|
1210-11-004
|
S350853-17-1
|
2016-03-02 17:47:56
|
CERN
|
INSTOCK
|
m20_1
|
0.0
|
1.13
|
54
|
M3172
|
A
|
B350853-17-1
|
1210-11-004
|
S350853-17-1
|
2016-03-02 17:47:56
|
CERN
|
INSTOCK
|
m20_2
|
0.0
|
1.13
|
42
|
M3172
|
A
|
B350853-17-1
|
1210-11-004
|
S350853-17-1
|
2016-03-02 17:47:56
|
CERN
|
INSTOCK
|
p17_1
|
1.1e-07
|
1.15
|
51
|
Database comparison - Pixel Defects
MoReWeb-v1.0.2-10-gbc52a17 on branch master