Test Date: 2016-07-27 18:50
Analysis date: 2016-07-27 19:16
M3171 ModuleReceptionTest_p17_1
Chips
Overview
Summary
Module |
Module |
M3171 |
|
Grade |
Grade |
A |
|
ManualGrade |
Manual grade |
- |
|
ElectricalGrade |
Electrical Grade |
A |
|
IVGrade |
IV Grade |
A |
|
DeadPixels |
Dead Pixels |
33 |
|
DefectiveBumps |
Bump Defects |
0 |
|
DefectiveBumpsMax |
Max BumpDef/ROC |
0 |
|
DeadPixelsMax |
Max Dead Pixels/ROC |
23 |
|
Readback |
Readback calibration |
ok |
|
IanaLoss
IanaLossProblems |
Iana problems |
No |
|
Mean |
mean |
21.05 |
|
Min |
min |
20.90 |
|
Max |
max |
21.70 |
|
NROCsNotProgrammable |
ROCs not programmable |
0 |
|
IVCurve
CurrentAtVoltage150V |
I(150 V) |
0.18 |
μA |
Variation |
I(150 V) / I(100 V) |
1.14 |
|
IV150DB |
I(150 V) Fulltest |
0.16 |
μA |
ReadbackStatus
ModuleCalibrationGood |
Readback Calibration |
ok |
|
ReadbackExplanation |
Colors |
Red means not calibrated or parameter value outside of bulk distribution |
|
Database comparison
FULLMODULE_ID
|
GRADE
|
BAREMODULE_ID
|
HDI_ID
|
SENSOR_ID
|
BUILTON
|
BUILTBY
|
STATUS
|
tempnominal
|
I150
|
IVSLOPE
|
PIXELDEFECTS
|
M3171
|
A
|
B350853-18-3
|
549-37-006
|
S350853-18-3
|
2016-02-04 17:06:39
|
CERN
|
INSTOCK
|
m20_1
|
0.0
|
1.08
|
51
|
M3171
|
B
|
B350853-18-3
|
549-37-006
|
S350853-18-3
|
2016-02-04 17:06:39
|
CERN
|
INSTOCK
|
m20_2
|
0.0
|
1.09
|
89
|
M3171
|
A
|
B350853-18-3
|
549-37-006
|
S350853-18-3
|
2016-02-04 17:06:39
|
CERN
|
INSTOCK
|
p17_1
|
1.6e-07
|
1.12
|
54
|
Database comparison - Pixel Defects
MoReWeb-v1.0.2-10-gbc52a17 on branch master