Test Date: 2015-07-30 09:25
Analysis date: 2015-10-28 15:13
M3022 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3022
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 43 - 16/0/0
DeadPixels Dead Pixels 14
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 9
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 18
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 2
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 14
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-07-30
TestTime Test Time 09:25
TestDuration Test Duration 1:03:29
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x30 0xf6
TBM2 TBM2 ok, 0x00 0xf6
PxarVersion pXar v2.2.5+67 g3b1c276
ModuleIa Module Ia 389.9 mA
Summary 3
Noise Noise 138.79 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 57.81 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1207.19 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.64
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.55 μA
CurrentVariation I(150 V) / I(100 V) 1.12
IVCurve
CurrentAtVoltage150V I(150 V) 0.55 μA
Variation I(150 V) / I(100 V) 1.12
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:03:29
MinCurrent min. Current 0.424 A
MaxCurrent max. Current 0.464 A
Analog Current
Duration Duration 1:03:29
MinCurrent min. Current 0.358 A
MaxCurrent max. Current 0.395 A
ModuleIa Module Ia 389.9 mA
Temperature
Temperature Temp. while test 16.71 +/- 0.24 °C
Duration Duration of test 0:05:20
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
0
0
3
0
0
0
0
0
0
0
140.23
1752
56
0.031
1048
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
130.88
1753
60
0.030
1344
Chip 2
A
1
1
0
0
0
0
0
0
0
0
1
134.79
1756
59
0.040
1300
Chip 3
A
4
0
0
1
0
0
0
3
0
0
2
147.23
1754
61
0.032
1562
Chip 4
A
2
0
0
1
0
0
0
1
0
0
0
141.65
1751
57
0.028
1076
Chip 5
A
6
0
0
3
0
0
0
3
1
0
0
150.83
1755
59
0.033
1329
Chip 6
A
5
4
0
1
0
0
0
0
0
0
4
140.85
1756
57
0.034
1094
Chip 7
A
6
5
0
1
0
0
0
0
1
0
4
150.39
1757
56
0.034
1189
Chip 8
A
6
3
0
3
0
0
0
0
0
0
3
150.14
1755
57
0.037
1084
Chip 9
A
3
1
0
0
1
0
0
1
2
0
0
128.15
1754
55
0.028
1214
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
141.46
1754
60
0.034
1448
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
122.83
1754
58
0.037
1182
Chip 12
A
1
0
0
0
0
0
0
1
0
0
0
131.40
1752
57
0.030
1022
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
135.04
1755
58
0.031
1254
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
132.64
1755
55
0.031
1110
Chip 15
A
4
0
0
3
1
0
0
0
1
0
0
142.17
1756
57
0.042
1060
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xf6
Core0a_basee Core 0a base e 0x30
Core0b_basea Core 0b base a 0xf6
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 6
RocDelay_Ch1 Roc Delay Ch1 6
RocDelay_Ch2 Roc Delay Ch2 6
RocDelay_Ch3 Roc Delay Ch3 6
Phase400 Phase 400 4
Phase160 Phase 160 1
Errors
nCriticals # Criticals 0
nErrors # Errors 13
nWarnings # Warnings 35
channel_0_count Channel 0 0
channel_1_count Channel 1 48
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 11
message_eventid_count Event ID mismatch 2
message_readback_count Readback start marker 35
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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