Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 18:48
M3021 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M3021
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 99 - 15/1/0
DeadPixels Dead Pixels 27
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 9
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 8
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 63
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 28
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-29
TestTime Test Time 13:48
TestDuration Test Duration 1:56:51
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x28 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 384.3 mA
Summary 3
Noise Noise 126.53 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.09 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 15/1/0
PedestalSpread Pedestal Spread 1072.31 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.77
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 0.00
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 0.00
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 0.00
CurrentRatio100V I(+17C)/I(-20C) 100V 60.37
CurrentRatio150V I(+17C)/I(-20C) 150V -1.00
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:56:51
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.536 A
Analog Current
Duration Duration 1:56:51
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 384.3 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.35
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -20.01 +/- 0.05 °C
Duration Duration of test 0:01:46
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
2
0
1
1
0
0
0
2
0
1
128.63
1750
44
0.034
1154
Chip 1
A
1
0
0
1
0
0
0
0
0
0
0
106.19
1749
44
0.031
996
Chip 2
A
2
0
0
1
0
0
1
0
0
0
0
99.98
1750
42
0.029
820
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
137.97
1748
44
0.033
1195
Chip 4
B
59
0
0
0
0
0
0
5
58
0
2
146.98
1750
52
0.107
1210
Chip 5
A
1
0
0
1
0
0
0
0
0
0
0
138.81
1748
48
0.031
1160
Chip 6
A
3
1
0
2
0
0
0
0
0
0
1
108.48
1750
43
0.034
822
Chip 7
A
4
4
0
0
0
0
0
0
0
0
4
130.88
1750
46
0.027
1044
Chip 8
A
6
6
0
0
0
0
0
0
0
0
6
129.17
1750
46
0.028
932
Chip 9
A
2
2
0
0
0
0
0
0
0
0
2
130.40
1748
44
0.029
1100
Chip 10
A
3
0
0
0
0
0
0
3
1
0
1
136.92
1748
47
0.028
1109
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
139.50
1752
46
0.028
1200
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
110.24
1748
42
0.032
1050
Chip 13
A
6
4
0
2
0
0
0
0
2
0
3
100.68
1750
42
0.032
982
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
137.25
1750
45
0.033
1152
Chip 15
A
8
8
0
0
0
0
0
0
0
0
8
142.34
1749
48
0.044
1230
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0x28
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 2
Phase160 Phase 160 1
Errors
nCriticals # Criticals 4
nErrors # Errors 114
nWarnings # Warnings 2
channel_0_count Channel 0 12
channel_1_count Channel 1 8
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 12
message_eventid_count Event ID mismatch 5
message_readback_count Readback start marker 2
message_notokenpass_count has NoTokenPass 1
message_datasize_count Data size criticals 2
message_missingevents_count Missing Event criticals 2
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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