Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 18:35
M3019 ModuleFulltestPxar_m20_1
Chips

Overview

_
Summary 1
Module Module M3019
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 73 - 16/0/0
DeadPixels Dead Pixels 17
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 3
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 35
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 17
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 18
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-29
TestTime Test Time 13:48
TestDuration Test Duration 1:28:44
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 385.9 mA
Summary 3
Noise Noise 132.38 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.12 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1121.56 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.75
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:28:44
MinCurrent min. Current 0.361 A
MaxCurrent max. Current 0.522 A
Analog Current
Duration Duration 1:28:44
MinCurrent min. Current 0.075 A
MaxCurrent max. Current 0.39 A
ModuleIa Module Ia 385.9 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.60
Min min 19.30
Max max 20.10
Temperature
Temperature Temp. while test -20.00 +/- 0.04 °C
Duration Duration of test 1:32:16
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
4
1
0
3
0
0
0
0
0
0
1
121.72
1748
44
0.035
1108
Chip 1
A
6
0
0
5
0
0
0
1
0
0
1
140.75
1749
48
0.031
1026
Chip 2
A
3
0
0
2
0
0
1
0
0
0
0
113.07
1750
42
0.033
1194
Chip 3
A
1
1
0
0
0
0
0
0
0
0
1
140.21
1740
45
0.044
964
Chip 4
A
1
0
0
1
0
0
0
0
0
0
0
126.05
1750
42
0.032
1038
Chip 5
A
1
0
0
1
0
0
0
0
0
0
0
129.15
1748
43
0.034
1196
Chip 6
A
1
0
0
1
0
0
0
0
0
0
0
135.02
1752
45
0.035
1173
Chip 7
A
6
2
0
3
0
0
0
1
0
0
2
138.20
1750
44
0.037
1093
Chip 8
A
3
2
0
1
0
0
0
0
0
0
2
126.31
1746
45
0.033
1110
Chip 9
A
3
1
0
2
0
0
0
0
0
0
1
130.86
1749
46
0.032
964
Chip 10
A
20
0
0
2
0
0
0
1
17
0
0
161.49
1750
52
0.091
1302
Chip 11
A
5
1
0
4
0
0
0
0
0
0
1
137.10
1750
48
0.034
1207
Chip 12
A
4
0
0
4
0
0
0
0
0
0
0
124.68
1752
44
0.037
1328
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
138.91
1747
44
0.034
1126
Chip 14
A
10
6
0
4
0
0
0
0
0
0
6
132.79
1750
47
0.034
1104
Chip 15
A
3
3
0
0
0
0
0
0
0
0
3
121.85
1748
43
0.029
1011
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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