Test Date: 2015-09-11 10:30
Analysis date: 2016-05-26 05:32
M2108 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M2108
Grade Grade B
ElectricalGrade Electrical Grade A
IVGrade IV Grade B
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 34 - 16/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 24
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 10
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-09-11
TestTime Test Time 10:30
TestDuration Duration 1:41:17
TempC Temparature 17 °C
TBM1 TBM1 ok, 0xe8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar prod-10+24 g09f6d2c
DTB_FW DTB FW 4.5
ModuleIa Module Ia 383.5 mA
Summary 3
Noise Noise 133.68 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 43.25 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1114.16 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.70
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 7.44 μA
CurrentVariation I(150 V) / I(100 V) 1.87
IVCurve
CurrentAtVoltage150V I(150 V) 7.44 μA
Variation I(150 V) / I(100 V) 1.87
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
mu μ 129.56
caldelspread CalDel spread 35
PHScale
mu μ 76.00
phscalespread PHScale spread 14
PHOffset
mu μ 171.75
phoffsetspread PHOffset spread 38
VthrComp
mu μ 95.56
vthrcompspread VthrComp spread 12
Vtrim
mu μ 102.56
vtrimspread Vtrim spread 85
Vana
mu μ 80.88
vanaspread Vana spread 25
Digital Current
Duration Duration 1:41:17
MinCurrent min. Current 0.369 A
MaxCurrent max. Current 0.476 A
Analog Current
Duration Duration 1:41:17
MinCurrent min. Current 0.075 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 383.5 mA
Temperature
Temperature Temp. while test 17.00 +/- 0.07 °C
Duration Duration of test 1:41:22
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
4
0
0
4
0
0
0
0
0
0
0
140.82
1748
43
0.040
1136
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
134.81
1751
46
0.032
1180
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
134.48
1748
42
0.033
1024
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
123.42
1752
42
0.034
1156
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
119.21
1747
40
0.028
1090
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
136.07
1750
42
0.037
1064
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
133.84
1750
41
0.031
1044
Chip 7
A
1
0
0
0
0
0
0
1
0
0
0
150.81
1746
49
0.037
1290
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
130.72
1750
41
0.040
1080
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
130.82
1748
42
0.032
1125
Chip 10
A
22
0
0
0
0
0
0
22
0
0
0
146.45
1748
57
0.041
1081
Chip 11
A
1
0
0
0
0
0
0
1
0
0
0
126.68
1748
41
0.033
1072
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
130.41
1747
40
0.043
1340
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
129.29
1750
40
0.028
1068
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
139.95
1744
44
0.037
1002
Chip 15
A
5
0
0
5
0
0
0
0
0
0
0
131.11
1752
42
0.031
1072
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
ModifiedGrading Modified Grading True
GradingParameters_leakageCurrentRatioB leakageCurrentRatioB 20 => -111
TBM
nTBMs n 1
TBMType Type tbm09c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 2
Phase160 Phase 160 7
Logfile

Overview

Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
MoReWeb-v1.0.0-5-g82d9ff6 on branch psi46master