Test Date: 2015-09-10 11:04
Analysis date: 2016-05-26 04:35
M2104 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M2104
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 15 - 16/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 2
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 13
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-09-10
TestTime Test Time 11:04
TestDuration Duration 1:34:05
TempC Temparature 17 °C
TBM1 TBM1 ok, 0x18 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-10+24 g09f6d2c
DTB_FW DTB FW 4.5
ModuleIa Module Ia 389.1 mA
Summary 3
Noise Noise 131.27 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 42.59 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1097.56 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.68
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.61 μA
CurrentVariation I(150 V) / I(100 V) 1.10
IVCurve
CurrentAtVoltage150V I(150 V) 0.61 μA
Variation I(150 V) / I(100 V) 1.10
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
mu μ 134.31
caldelspread CalDel spread 41
PHScale
mu μ 72.81
phscalespread PHScale spread 14
PHOffset
mu μ 175.31
phoffsetspread PHOffset spread 33
VthrComp
mu μ 95.50
vthrcompspread VthrComp spread 19
Vtrim
mu μ 96.50
vtrimspread Vtrim spread 27
Vana
mu μ 86.81
vanaspread Vana spread 21
Digital Current
Duration Duration 1:34:05
MinCurrent min. Current 0.374 A
MaxCurrent max. Current 0.485 A
Analog Current
Duration Duration 1:34:05
MinCurrent min. Current 0.069 A
MaxCurrent max. Current 0.392 A
ModuleIa Module Ia 389.1 mA
Temperature
Temperature Temp. while test 17.00 +/- 0.09 °C
Duration Duration of test 0:09:32
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
0
0
1
0
0
0
0
0
0
0
139.51
1749
44
0.041
972
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
127.25
1750
43
0.031
1163
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
127.26
1750
40
0.040
1180
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
126.61
1748
42
0.031
1136
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
127.54
1750
42
0.028
1232
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
133.80
1750
42
0.034
1192
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
128.15
1748
42
0.027
1007
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
128.10
1747
44
0.034
1382
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
125.83
1750
42
0.034
987
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
114.07
1750
42
0.036
1132
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
137.07
1750
43
0.030
1082
Chip 11
A
2
0
0
1
0
0
0
1
0
0
0
141.58
1748
44
0.042
980
Chip 12
A
1
0
0
0
0
0
0
1
0
0
0
131.45
1748
43
0.032
1128
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
132.20
1748
42
0.028
878
Chip 14
A
4
0
0
4
0
0
0
0
0
0
0
144.40
1748
44
0.030
1147
Chip 15
A
7
0
0
7
0
0
0
0
0
0
0
135.48
1746
42
0.031
962
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
ModifiedGrading Modified Grading True
GradingParameters_leakageCurrentRatioB leakageCurrentRatioB 20 => -111
TBM
nTBMs n 1
TBMType Type tbm09c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0x18
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 0
Logfile

Overview

Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
MoReWeb-v1.0.0-5-g82d9ff6 on branch psi46master