Test Date: 2015-09-10 11:04
Analysis date: 2016-05-26 01:56
M2076 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M2076
Grade Grade C
ElectricalGrade Electrical Grade C
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 1806 - 15/0/1
DeadPixels Dead Pixels 2
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1745
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 36
NoisyPixels Noise Defects 16
TrimProblems Trim Problems 490
PHGainDefects PH Gain Defects 41
PHPar1Defects PH Parameter1 Defects 1
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-09-10
TestTime Test Time 11:04
TestDuration Duration 2:01:10
TempC Temparature 17 °C
TBM1 TBM1 ok, 0x88 0x52
TBM2 TBM2 ok, 0x00 0x52
PxarVersion pXar prod-10+24 g09f6d2c
DTB_FW DTB FW 4.5
ModuleIa Module Ia 377.8 mA
Summary 3
Noise Noise 138.88 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 42.84 e
VcalThrWidthROCs Vcal Thr. W. grades 15/0/1
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 15/1/0
PedestalSpread Pedestal Spread 1250.94 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.68
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 1.15 μA
CurrentVariation I(150 V) / I(100 V) 1.28
IVCurve
CurrentAtVoltage150V I(150 V) 1.15 μA
Variation I(150 V) / I(100 V) 1.28
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
mu μ 127.19
caldelspread CalDel spread 27
PHScale
mu μ 70.81
phscalespread PHScale spread 17
PHOffset
mu μ 179.31
phoffsetspread PHOffset spread 27
VthrComp
mu μ 95.56
vthrcompspread VthrComp spread 60
Vtrim
mu μ 116.75
vtrimspread Vtrim spread 145
Vana
mu μ 81.12
vanaspread Vana spread 11
Digital Current
Duration Duration 2:01:10
MinCurrent min. Current 0.371 A
MaxCurrent max. Current 0.475 A
Analog Current
Duration Duration 2:01:10
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.381 A
ModuleIa Module Ia 377.8 mA
Temperature
Temperature Temp. while test 17.00 +/- 0.07 °C
Duration Duration of test 2:01:12
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
C
1787
1
0
22
490
0
16
1741
40
0
1
153.13
1726
12
0.131
1972
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
140.02
1748
45
0.036
1180
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
130.56
1748
42
0.032
955
Chip 3
A
2
1
0
0
0
0
0
1
1
0
0
140.90
1748
48
0.033
1332
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
130.60
1750
43
0.029
1102
Chip 5
A
2
0
0
0
0
0
0
2
0
0
0
131.21
1749
44
0.033
1170
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
130.99
1749
46
0.026
1164
Chip 7
A
1
0
0
1
0
0
0
0
0
0
0
136.27
1751
45
0.034
1108
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
144.83
1750
43
0.034
1029
Chip 9
A
0
0
0
0
0
0
0
0
0
0
0
141.40
1750
44
0.032
1228
Chip 10
A
10
0
0
10
0
0
0
0
0
0
0
140.71
1748
45
0.028
1324
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
142.16
1749
44
0.027
1343
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
140.66
1750
43
0.031
1194
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
133.80
1748
46
0.027
1354
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
148.07
1750
48
0.031
1269
Chip 15
A
4
0
0
3
0
0
0
1
0
0
0
136.79
1751
46
0.032
1290
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
ModifiedGrading Modified Grading True
GradingParameters_leakageCurrentRatioB leakageCurrentRatioB 20 => -111
TBM
nTBMs n 1
TBMType Type tbm09c
Core0a_basea Core 0a base a 0x52
Core0a_basee Core 0a base e 0x88
Core0b_basea Core 0b base a 0x52
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 2
RocDelay_Ch1 Roc Delay Ch1 2
RocDelay_Ch2 Roc Delay Ch2 2
RocDelay_Ch3 Roc Delay Ch3 2
Phase400 Phase 400 2
Phase160 Phase 160 4
Logfile

Overview

Errors
nCriticals # Criticals 0
nErrors # Errors 0
nWarnings # Warnings 0
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
MoReWeb-v1.0.0-5-g82d9ff6 on branch psi46master